Day 1: 8:30am to 4:30pm
Day 2: 8:30am to 3:30pm
Control systems engineers, instrument engineers, and process safety specialists
$990. Class registration is through Texas A&M University’s Mary Kay O’Connor Process Safety Center. http://psc.tamu.edu/education/schedule-of-classes-registration
SIL Verification calculations analyze the design and maintenance strategy for SIFs and prove that the performance targets are met calculation of the probability of failure on demand (PFD) and spurious trip rate (STR). This course covers fundamental concepts, such as failure modes and effects, failure rate data, key design parameters, and the calculation methodology. The course presents a series of examples as workshops to illustrate the important concepts and assumptions implicit in the calculations.
- Overview of SIS standards
- Failure fundamentals-Failure Modes and Effects Analysis (FMEA)
- Introduction to the math for probability of failure on demand and spurious trip rate
- Key Elements
- Integrity – where do you get data from? What does it mean?
- Voting/Fault Tolerance – why do you need redundancy? How does it help?
- Test Interval – how does the test interval affect the integrity?
- Diagnostic Coverage – what effect does diagnostics have?
- Common Cause – how is this modeled?
- Periodic Workshops throughout the day
- How to read manufacturer certification reports
- How to model SIF based on LOPA recommendations
- Understanding mean time to failure and useful life
- Partial stroke testing and diagnostic coverage
- Example System
- Impact of diagnostics and need for compensation measures
- Calculation demonstration showing the impact of redundancy
- Workshops — problems worked by students. Various cases will be modeled showing how changes to design and maintenance strategy affect results.
Course developed by Dr. Angela Summers and William Hearn